About this organization

Organization Name: LayTec AG

Organization Solution and Services

  • Power Electronics & Control, Semi, Thyristors, MOSFETs, Sensing, LED

  • PV/Solar Components, Tracker, Junction box, connectors, Racking and Mounting Eq, Module-level monitoring, Solar line manufacturing Machine

    Organization Types:

  • Manufacture
  • Organization Size: Revenue in the 10M-100M range
  • Revenue: $13.6 million

  • Organization Years In business: 10+ Years

Organization Information : Founded in 1999 as a spin‑off of TU Berlin, LayTec AG is a global leader in integrated optical metrology for thin-film processes. Headquartered in Berlin, Germany, the company designs and manufactures in‑situ, in‑line, lab‑line, and map‑line metrology systems used across industries—such as photovoltaics, solar cell manufacturing, compound semiconductors (LEDs, lasers), displays, and flat-panel electronics. LayTec systems deliver real-time measurements of layer thickness, temperature, curvature, growth rate, emissivity, and uniformity during deposition processes, enabling process control, quality assurance, and yield optimization. With over 3,500 systems installed worldwide and a comprehensive international support network, LayTec empowers both industrial facilities and R&D labs to accelerate innovation, reduce costs, and improve thin-film quality.

Other Information: Founded in 1999, LayTec is a major provider of in-situ and in-line optical metrology for thin-film processes. These metrology tools are used in a broad range of thin-film applications such as LED & LASER production, thin-film photovoltaics, oxide and organic deposition as well as other large area deposition processes. LayTec’s integrated metrology provides access to all key thin-film parameters in real-time – either in-situ, during the deposition process, or in-line. Recently, also in-situ metrology tools for dry etching have been added expanding LayTec’s portfolio along the production chain. Beyond these integrated methods, LayTec also offers mapping solutions which ideally complement in-situ measurements by providing uniformity analysis of the deposited layers. The implementation of LayTec metrology systems in production processes significantly shortens development cycles and enables an efficient quality control that helps to considerably reduce production and development costs.

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